Test

The Test Device is used to demonstrate features of DAQ Plot, see the Simulation tutorial to learn how to activate this feature. The test preference pane is shown below.

The test device can be useful to test methodology for data storage and analysis without having hardware.

The following details the Test parameters.

Number Of Signals: Varies from one to sixteen. Choose a number similar to what you will use in practice.
Noise: Defines the amount of noise relative to the signal. This is very valuable for determining average and fit parameters in the Derived processing. Once you start using derivatives and feedback loops then noise plays an important role in determining algorithm selections.
Sine Parameters: Defined by A sin(t P). A is the amplitude and is set between 0 and 10, P is the period and is set to one second per cycle when the slider is to the right and infinite (flat) when the slider is to the left. The Period offset slider offsets the period on a per channel basis so that the period can vary per channel.
Harmonic Parameters: Defined by A (cos(t P) + sin(2 t P) + cos(3 t P) + sin(4 t P))/4. A is the amplitude and is set between 0 and 10, P is the period and is set to one second per cycle when the slider is to the right and infinite (flat) when the slider is to the left. The Period offset slider offsets the period on a per channel basis so that the period can vary per channel.
Step Function Parameters: Defined by A when t is an even second and 0 when t is an odd second (excluding fraction) when the Period slider is set to the right. The alternate values are more rapid when the slider is moved left. The Period offset slider offsets the period on a per channel basis so that the period can vary per channel.
Channel Offset: adds 10 times channel index when the slider is to the right and less offset as the slider is moved to the left. Move the slider all the way to the right to separate the signals and move the slider all the way to the left when looking at spectra so that there is no DC bias.
Seconds Offset: adds the seconds value to each signal when the slider is to the right, and a lesser amount per channel when the slider is moved to the left.
User Defined Offset: Each signal increases when the slider is moved to the right and decreases when the slider is moved to the left.

Notice how the Test signal has no Apply button, unlike Hardware Preference panes. That is because the parameters of the test signal are orthogonal, meaning one state does not invalidate another state. That is unlike programing DAQ hardware states where the states must be consistent with each other. Because the state of the test signals is applied when changed you can alter them dynamically and see the result in the plot output which also permits experimentation of the attributes in real time as they apply to more complex processing of the Derived parameters.